Achieve superior vacuum performance for SEM and TEM
SAES high vacuum and ultra-high vacuum (UHV) pumps deliver unmatched benefits for electron microscopy, ensuring stable, clean vacuum environments that are critical for the best image resolution and data accuracy in Scanning Electron Microscopes (SEM), Transmission Electron Microscopes (TEM), and Focused Ion Beam (FIB) systems.
By maintaining a superior vacuum in the electron gun chamber, SAES pumps help reduce contamination, enable higher beam stability, and enhance the overall performance of advanced electron microscopy instruments. This proven technology has supported milestone scientific results—such as the high-resolution TEM images that played a key role in the development of an mRNA Covid-19 vaccine.
From academic labs to semiconductors apps, SAES vacuum solutions provide reliable, vibration-free performance for cutting-edge surface analysis, nanostructure characterization, life and material science research, metrology in semiconductors manufacturing.
Innovative technologies for exceptional results
Compact & Lightweight Design
Only 2.2 Kg pump weight, reducing vibrations and making it easy to handle and install.
High Pumping Speed
High pumping rate for H2 and active gas species, leading to lower pressure and longer e-source lifetime.
Pumping Without Power
SAES NEG pumps keep pumping without power, enabling manufacturers to transport the microscopes in vacuum without any batteries.
The ultimate benefit is faster system installation, being not necessary to repeat the bake at the end user site.
A further appreciated benefit is the quick recovery in case of power failure.
